ESR and PL characterization of point defects in CuGaSe<sub>2</sub> single crystals.

NISHI T; KATSUMATA Y; SATO K; MIYAKE H

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J-GLOBAL ID：200902197665525368 Reference number：01A0387276

ESR and PL characterization of point defects in CuGaSe₂ single crystals.

CuGaSe₂単結晶中の点欠陥のESRとPL特性化

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Volume： 67 Issue： 1/4 Page： 273-278 Publication year： Mar. 2001
JST Material Number： D0513C ISSN： 0927-0248 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Lattice defects in semiconductors , EPR of metals and semiconductors , Luminescence of semiconductors

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ESR and PL characterization of point defects in CuGaSe2 single crystals.

ESR and PL characterization of point defects in CuGaSe₂ single crystals.