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J-GLOBAL ID:200902204108080260   Reference number:04A0785945

Bottom Coverage of Cu Deposit for 200-nm-Class Circular Vias with High Aspect Ratios Investigated by Magnetron Sputtering Activated Using Superconducting Bulk Magnet

超伝導バルク磁石を用いて活性化されたマグネトロンスパッタリングにより調べた高いアスペクト比を持つ200nmクラスの円形通路に対するCu蒸着による底面被覆
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Volume: 43  Issue: 9A  Page: 6026-6031  Publication year: Sep. 15, 2004 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Metallic thin films 
Reference (20):
  • 1) D. Edelstein, J. Heidenreich, R. Goldblatt, W. Cote, C. Uzoh, N. Lustig, P. Roper, T. McDevitt, W. Motsiff, A. Simon, J. Dukovic, R. Wachnik, H. Rathore, R. Schulz, L. Su, S. Luce and J. Slattery: IEEE IEDM Tech. Dig., 1997, p. 773.
  • 2) S. W. Russell, A. J. McKerrow, W.-Y. Shih, A. Singh, R. S. List, A. R. K. Ralston, W. W. Lee, K. J. Newton, M.-C. Chang and R. H. Havemann: Proc. ADMETA Conf., 1997, p. 289.
  • 3) J. G. Ryan, J. E. Heidenreich, W. J. Cote, R. M. Geffken and T. N. Theis: Proc. ADMETA Conf., 1997, p. 399.
  • 4) K. Holloway, P. M. Fryer, C. Cabral, Jr., J. M. E. Harper, P. J. Bailey and K. H. Kelleher: J. Appl. Phys. 71 (1992) 5433.
  • 5) B. Chin, P. Ding, B. Sun, T. Chiang, D. Angelo, I. Hashim, Z. Xu, S. Edelstein and F. Chen: Solid State Tech. 41 (1998) 141.
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