Robustness of Self-Isolation High-Voltage Integrated Circuits against the Voltage Surge during Conductivity Modulation Delay in Free-Wheeling Diode

YAMAZAKI Tomoyuki; YAMAZAKI Tomoyuki; KUMAGAI Naoki; NISHIURA Akira; FUJIHIRA Tatsuhiko; MATSUMOTO Takashi

Art

J-GLOBAL ID：200902204216533069 Reference number：07A0255489

Robustness of Self-Isolation High-Voltage Integrated Circuits against the Voltage Surge during Conductivity Modulation Delay in Free-Wheeling Diode

自由ホイーリングダイオードにおける伝導率変調遅延時における電圧サージに対する自己絶縁高電圧集積回路の耐性

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=07A0255489&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=07A0255489&from=J-GLOBAL&jstjournalNo=G0520B") }}

Author (6)： , , , , ,
Material：
Volume： 46 Issue： 2 Page： 569-571 Publication year： Feb. 15, 2007
JST Material Number： G0520B ISSN： 0021-4922 Document type： Article
Article type：短報 Country of issue： Japan (JPN) Language： ENGLISH (EN)

,...
,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=07A0255489&from=J-GLOBAL&jstjournalNo=G0520B") }}

Semiconductor integrated circuit

Reference (10)：

N. Sakurai, M. Mori, and T. Yatsuo: Proc.2nd Int. Symp. Power Semiconductor Devices and IC’s, Tokyo, 1990, p. 66.
A. Nakagawa, H. Funaki, Y. Yamaguchi, and F. Suzuki: Proc. list Int. Symp. Power Semiconductor Devices and IC’s, Toronto, 1999, p. 321.
H. Akiyama, N. Yasuda, J. Moritani, K. Takanashi, and G. Majumdar: 16th Int. Symp. Power Semiconductor Devices and IC’s, Kitakyushu, 2004, p. 375.
T. Terashima, M. Yoshizawa, M. Fukunaga, and G. Majumdar: Proc.5th Int. Symp. Power Semiconductor Devices and IC’s, Monterey, 1993, p. 224.
J. S. Ajit, D. Kinzer, and N. Ranjan: Proc.5th Int. Symp. Power Semiconductor Devices and IC’s, Monterey, 1993, p. 230.

ｍore...

, , , , , , ,

Return to Previous Page