Imaging of all Dangling Bonds and their Potential on the Ge/Si(105) Surface by Noncontact Atomic Force Microscopy

EGUCHI T; FUJIKAWA Y; AKIYAMA K; AN T; HASHIMOTO T; MORIKAWA Y; TERAKURA K; SAKURAI T; LAGALLY M G

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J-GLOBAL ID：200902209476325801 Reference number：05A0128471

Imaging of all Dangling Bonds and their Potential on the Ge/Si(105) Surface by Noncontact Atomic Force Microscopy

非接触原子間力顕微鏡によるGe/Si(105)表面上のすべてのダングリングボンドとそのポテンシャルのイメージング

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Material：
Volume： 93 Issue： 26,Pt.1 Page： 266102.1-266102.4 Publication year： Dec. 31, 2004
JST Material Number： H0070A ISSN： 0031-9007 CODEN： PRLTAO Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Surface structure of semiconductors

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