Art

J-GLOBAL ID：200902212153013097   Reference number：07A0157766

Tip artifact in atomic force microscopy observations of InAs quantum dots grown in Stranski-Krastanow mode

Stranski-Krastanowモードにおいて成長されたInAs量子ドットの原子間力顕微鏡観察における先端人工物

Author (10)： SHIRAMINE Ken-ichi (Dep. of Applied Physics, Graduate School of Engineering, Hokkaido Univ., Sapporo 060-8628, JPN) ,  MUTO Shunichi (Dep. of Applied Physics, Graduate School of Engineering, Hokkaido Univ., Sapporo 060-8628, JPN) ,  SHIBAYAMA Tamaki (Center for Advanced Res. of Energy Conversion Materials, Hokkaido Univ., Sapporo 060-8628, JPN) ,  SAKAGUCHI Norihito (Center for Advanced Res. of Energy Conversion Materials, Hokkaido Univ., Sapporo 060-8628, JPN) ,  ICHINOSE Hideki (Center for Advanced Res. of Energy Conversion Materials, Hokkaido Univ., Sapporo 060-8628, JPN) ,  KOZAKI Tamotsu (Div. of Energy and Environmental System, Graduate School of Engineering,Hokkaido Univ., Sapporo 060-8628, JPN) ,  SATO Seichi (Div. of Energy and Environmental System, Graduate School of Engineering,Hokkaido Univ., Sapporo 060-8628, JPN) ,  NAKATA Yoshiaki (Fujitsu Laboratories, Ltd., Atsugi 243-0197, JPN) ,  YOKOYAMA Naoki (Fujitsu Laboratories, Ltd., Atsugi 243-0197, JPN) ,  TANIWAKI Masafumi (Dep. of Environmental Systems Engineering, Kochi Univ. of Technol., Tosayamada, Kochi 782-8502, JPN)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 101  Issue： 3  Page： 033527-033527-5  Publication year： Feb. 01, 2007 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *quantum dot ,...

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JST classification (1)： Microscopy determination of structures  (BK01040E)

Terms in the title (4)： 成長 ,  InAs量子ドット ,  原子間力顕微鏡観察 ,  人工物