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J-GLOBAL ID：200902213621623163   Reference number：08A0818586

X-ray diffraction study of polycrystalline BiFeO₃ thin films under electric field

多結晶BiFeO₃薄膜の電場下でのX線回折研究

Author (6)： NAKASHIMA Seiji (Dep. of Systems Innovation, Graduate School of Engineering Sci., Osaka Univ., 1-3 Machikaneyama-Cho, Toyonaka, Osaka ...) ,  SAKATA Osami (Japan Synchrotron Radiation Res. Institute/SPring-8, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, JPN) ,  NAKAMURA Yoshitaka (Dep. of Systems Innovation, Graduate School of Engineering Sci., Osaka Univ., 1-3 Machikaneyama-Cho, Toyonaka, Osaka ...) ,  KANASHIMA Takeshi (Dep. of Systems Innovation, Graduate School of Engineering Sci., Osaka Univ., 1-3 Machikaneyama-Cho, Toyonaka, Osaka ...) ,  FUNAKUBO Hiroshi (Dep. of Innovative and Engineered Materials, Interdisciplinary Graduate School of Sci. and Technol., Tokyo Inst. of ...) ,  OKUYAMA Masanori (Dep. of Systems Innovation, Graduate School of Engineering Sci., Osaka Univ., 1-3 Machikaneyama-Cho, Toyonaka, Osaka ...)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 93  Issue： 4  Page： 042907  Publication year： Jul. 28, 2008 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： ferroelectrics ,  *bismuth compound ,  *ferrate ,  polycrystal ,  dielectric thin film ,  crystal orientation ,  constant ,  synchrotron radiation ,  *measurement by X-ray system ,  impulse response ,  spectral line shift ,  *piezoelectricity ,  *piezoelectric constant

JST classification (2)： Piezoelectricity,pyroelectricity,electret  (BM05040M) ,  X-ray instruments and techniques  (BA02060D)

Terms in the title (6)： 多結晶 ,  BiFeO3 ,  薄膜 ,  電場 ,  X線回折 ,  研究