Art
J-GLOBAL ID：200902215989136699
Reference number：04A0899448
Numerical Foundation of Hot-Electron Diffraction Experiment Based on Ballistic Electron Emission Microscope
弾道電子放出顕微鏡をベースにしたホット電子回折実験の数値基礎
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Author (3)：
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Material：
Volume：
43
Issue：
11A
Page：
7390-7394
Publication year：
Nov. 15, 2004
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures
Terms in the title (5)：
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