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J-GLOBAL ID：200902217570105982   Reference number：06A0338285

How Humidity Affects on Scanning Nonlinear Dielectric Microscope

走査型非線形誘電顕微鏡に湿度はどのように影響するか

Author (8)： KURAMOCHI Hiromi (Res. Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Inst. of Advanced Industrial Sci. ...) ,  KURAMOCHI Hiromi (SII Nanotechnology, JPN) ,  ANDO Kazunori (Res. Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Inst. of Advanced Industrial Sci. ...) ,  ANDO Kazunori (SII Nanotechnology, JPN) ,  HASUMURA Satoshi (SII Nanotechnology, JPN) ,  WATANABE Kazutoshi (SII Nanotechnology, JPN) ,  YOKOYAMA Hiroshi (Res. Consortium for Synthetic Nano-Function Materials Project (SYNAF), National Inst. of Advanced Industrial Sci. ...) ,  YOKOYAMA Hiroshi (Nanotechnology Res. Inst., AIST, JPN)
Material： e-Journal of Surface Science and Nanotechnology (Web)  (表面科学とナノテクノロジー)
Volume： 4  Page： 454-459 (J-STAGE)  Publication year： 2006 
JST Material Number： U0016A  ISSN： 1348-0391  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *nonlinearity ,...

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JST classification (1)： Measuring techniques and equipments of dielectric properties  (BM05020Q)

Reference (23)：

• [1] Y. Cho, A. Kirihara, and T. Saeki, Rev. Sci. Instrum. 67, 2297 (1996).
• [2] K. Ohara and Y. Cho, Integrated Ferroelectrics 50, 209 (2002).
• [3] Y. Cho, K. Ohara, and H. Odagawa, Ferroelectrics 269, 207 (2002).
• [4] K. Terabe, M. Nakamura, S. Takekawa, K. Kitamura, S. Higuchi, Y. Gotoh, and Y. Cho, Appl. Phys. Lett. 81, 4401 (2002).
• [5] K. Ohara and Y. Cho, J. Appl. Phys. 96, 7460 (2004).

Terms in the title (4)： 走査型 ,  非線形 ,  顕微鏡 ,  湿度