Art
J-GLOBAL ID:200902224662222388   Reference number:08A0865784

Characteristics improvement of HfO2/Ge gate stack structure by fluorine treatment of germanium surface

HfO2/Geゲートスタック構造のゲルマニウム表面のフッ素処理による特性改善
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Material:
Volume: 254  Issue: 21  Page: 6932-6936  Publication year: Aug. 30, 2008 
JST Material Number: B0707B  ISSN: 0169-4332  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
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JST classification
Category name(code) classified by JST.
Metal-insulator-semiconductor structures  ,  Oxide thin films 

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