Art
J-GLOBAL ID:200902232506996163   Reference number:04A0501014

Electron channeling X-ray microanalysis for site occupation in β-FeSi2 doped with Co

Coをドープしたβ-FeSi2の格子位置占有に対する電子チャネリングX線微小解析
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Material:
Volume: 52  Issue:Page: 35-41  Publication year: Mar. 2004 
JST Material Number: D0448C  ISSN: 1044-5803  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Lattice defects in metals 

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