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J-GLOBAL ID:200902254818961956   Reference number:04A0504117

Micro Bubbles Captured at Micro Defect on Resist Film

レジストフィルム上の微小欠陥(Micro Defect)で捕捉されるマイクロバブル(Micro Bubbles)
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Volume: 17  Issue:Page: 105-106  Publication year: 2004 
JST Material Number: L0202A  ISSN: 0914-9244  CODEN: JSTEEW  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Manufacturing technology of solid-state devices 
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Reference (3):
  • 1. A. Kawai and H. Endo, Ext. Abstr. 51th Spring Meet. Japan Society of Applied Physics and Related Societies, Tokyo, March, (2004) 777, No.29a-G-9.
  • 2. F. M. Fowks, Ind. Eng. Chem., 56 (1964) 40.
  • 3. D. H. Kaelble, J. Appl. Polym. Sci., 18 (1974) 1869.
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