Art

J-GLOBAL ID：200902256102956970   Reference number：09A0955751

Fabrication of cosputtered Zn-In-Sn-O films and their applications to organic light-emitting diodes

同時スパッタしたZn-In-Sn-O膜の作製と有機発光ダイオードへの応用

Author (6)： HEO Gi-seok (Nanoelectronics Team, Honam Technol. Serv. Div., Korea Inst. of Industrial Technol., Gwangju, 500-480, KOR) ,  MATSUMOTO Yuji (Materials and Structures Lab., Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama, 226-8503, JPN) ,  GIM In-gi (Nanoelectronics Team, Honam Technol. Serv. Div., Korea Inst. of Industrial Technol., Gwangju, 500-480, KOR) ,  PARK Jong-woon (Nanoelectronics Team, Honam Technol. Serv. Div., Korea Inst. of Industrial Technol., Gwangju, 500-480, KOR) ,  KIM Kwang-young (Nanoelectronics Team, Honam Technol. Serv. Div., Korea Inst. of Industrial Technol., Gwangju, 500-480, KOR) ,  KIM Tae-won (Nanoelectronics Team, Honam Technol. Serv. Div., Korea Inst. of Industrial Technol., Gwangju, 500-480, KOR)
Material： Solid State Communications  (Solid State Commun)
Volume： 149  Issue： 41-42  Page： 1731-1734  Publication year： Nov. 2009 
JST Material Number： H0499A  ISSN： 0038-1098  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *zinc compound ,  *indium compound ,  *tin compound ,  oxide ,  amorphous semiconductor ,  semiconductor thin film ,  *thin film growth ,  magnetron sputtering ,  temperature dependence ,  organic semiconductor ,  *light emitting diode ,  electrical resistivity ,  sheet resistance ,  carrier density ,  Hall mobility ,  optical absorption spectrum ,  work function ,  current-voltage characteristic ,  X-ray diffraction ,  surface roughness ,  micro structure ,  microscopy ,  atomic force microscope
Semi thesaurus term： *organic LED

JST classification (2)： Semiconductor thin films  (BK14040E) ,  Light emitting devices  (NC03082G)

Substance index (2)： Aluminum tris(quinoline-8-olate) ,  NPB

Terms in the title (6)： スパッタ ,  Zn ,  Sn ,  作製 ,  有機発光ダイオード ,  応用