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J-GLOBAL ID：200902257556756638   Reference number：05A0703494

Three-Dimensional Measurement for Absolute Value of Polarization Angle by Scanning Nonlinear Dielectric Microscopy

走査型非線形誘電率顕微鏡による分極角度絶対値の三次元測定

Author (3)： SUGIHARA Tomoyuki (Tohoku Univ., Sendai, JPN) ,  ODAGAWA Hiroyuki (Tohoku Univ., Sendai, JPN) ,  CHO Yasuo (Tohoku Univ., Sendai, JPN)
Material： Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)
Volume： 44  Issue： 6B  Page： 4325-4329  Publication year： Jun. 30, 2005 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *ferroelectrics ,...
Semi thesaurus term： 走査型非線形誘電率顕微鏡 ,...

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JST classification (2)： Ferroelectrics,antiferroelectrics and ferroelasticity  (BM05030B) ,  Measuring techniques and equipments of dielectric properties  (BM05020Q)

Reference (15)：

• 1) Y. Cho, K. Fujimoto, Y. Hiranaga and Y. Wagatsuma: Appl. Phys. Lett. 81 (2002) 4401.
• 2) S. E. Park, S. Wada, L. E. Cross and T. R. Shrout: J. Appl. Phys. 86 (1999) 2746.
• 3) A. Gruverman, O. Auciello, R. Ramesh and H. Tokumoto: Nanotechnology 8 (1997) A38.
• 4) L. M. Eng, H. J. Gu, G. A. Schneider, U. Kopke and J. Munoz Saldana: Appl. Phys. Lett. 74 (1999) 233.
• 5) G. Zavala, J. H. Fendler and S. Trolier-McKinstry: J. Appl. Phys. 81 (1997) 7480.

Terms in the title (4)： 走査型非線形誘電率顕微鏡 ,  分極 ,  絶対値 ,  三次元測定