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J-GLOBAL ID：200902271185324015   Reference number：07A0224268

Novel fabrication technologies of planar nano-gap electrodes for single molecule evaluation

単一分子の評価のための,平面ナノギャップ電極の新しい製造法

Author (15)： TSUTSUI Ken (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  NAKATA Masashi (Graduate School of Sci. and Engineering, Waseda Univ., Tokyo, JPN) ,  NAKATA Masashi (CREST-JST) ,  MORITA Masayuki (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  TOKUDA Masahide (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  NAGATSUMA Kazuyuki (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  ONOZATO Harumasa (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  KANEKO Tadao (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  EDURA Tomohiko (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  MITA Yoshio (VDEC, The Univ. of Tokyo, Tokyo, JPN) ,  KOINUMA Hideomi (Graduate School of Frontier Sciences, The Univ. of Tokyo, Tokyo, JPN) ,  KOINUMA Hideomi (CREST-JST) ,  WADA Yasuo (Nanotechnology Res. Lab., Waseda Univ., Tokyo 162-0041, JPN) ,  WADA Yasuo (Graduate School of Sci. and Engineering, Waseda Univ., Tokyo, JPN) ,  WADA Yasuo (CREST-JST)
Material： Current Applied Physics  (Curr Appl Phys)
Volume： 7  Issue： 4  Page： 329-333  Publication year： May. 2007 
JST Material Number： W1579A  ISSN： 1567-1739  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Thesaurus term： *molecular device ,...
Semi thesaurus term： ナノギヤップ電極

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JST classification (1)： Manufacturing technology of solid-state devices  (NC03030V)

Terms in the title (4)： 単一分子 ,  評価 ,  ナノギャップ電極 ,  製造法