Art

J-GLOBAL ID：200902272382089261   Reference number：05A0431632

Analysis of grain boundaries in CoCrTa and CoPtCrB HDD media by analytical transmission electron microscopy

解析透過型電子顕微鏡によりCoCrTa及びCoPtCrB HDDメディアの粒界解析

Author (3)： SHODA Kaoru (UBE Scientific Analysis Lab., Inc., Yamaguchi) ,  MATSUBARA Tohoru (UBE Scientific Analysis Lab., Inc., Yamaguchi) ,  TAKEDA Seiji (Osaka Univ., Osaka, JPN)
Material： Journal of Electron Microscopy  (J Electron Microsc)
Volume： 54  Issue： 1  Page： 1-9  Publication year： Jan. 2005 
JST Material Number： W1384A  ISSN： 0022-0744  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *transmission electron microscope ,...
Semi thesaurus term： lapping ,...

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JST classification (1)： Electronic recording,magnetic recording,optical recording  (NC06020F)

Reference (22)：

• DAVAL, J. Electron microscopy on high-coercive-force Co-Cr composite films. IEEE Trans. Magn. 1970, 6, 768-773
• LAL, B B. A new series of quaternary Co-alloys for high-density rigid-disk applications. IEEE Trans. Magn. 1991, 27, 4739-4741
• NOLAN, T P. Effect of microstructural features on media noise in longitudinal recording media. J. Appl. Phys. 1993, 73, 5566-5568
• NGUYEN, T A. Enhanced coercivity in CoPtCr thin film media using CrV underlayer. J. Appl. Phys. 1993, 73, 5579
• PARKER, M A. A cross-section TEM study of the microstructural evolution of CoPtCr/Cr thin films and the effect on magnetic properties. IEEE Trans. Magn. 1991, 27, 4730-4732

Terms in the title (4)： 解析 ,  透過型電子顕微鏡 ,  HDD ,  粒界