Monitoring Conditions of Cantilever during Conducting Atomic Force Microscopy Spectroscopy Measurements

OOHIRA Tsunehiro; ANDO Atsushi

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J-GLOBAL ID：200902278061885153 Reference number：06A0320863

Monitoring Conditions of Cantilever during Conducting Atomic Force Microscopy Spectroscopy Measurements

導電性原子間力顕微鏡法による分光測定中のカンチレバー状態の追跡

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Material：
Volume： 45 Issue： 3B Page： 1934-1936 Publication year： Mar. 30, 2006
JST Material Number： G0520B ISSN： 0021-4922 Document type： Article
Article type：短報 Country of issue： Japan (JPN) Language： ENGLISH (EN)

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Microscopy determination of structures

Reference (4)：

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M. Porti, M. Nafria, X. Aymerich, A. Ol-brich and B. Ebersberger: Appl. Phys. Lett.78(2001)4181.
A. Ando, R. Hasunuma, T. Maeda, K. Sakamoto, K. Miki, Y. Nishioka and T. Sakamoto: Appl. Surf. Sci.162-163(2000)401.
M. Porti, M. Nafria, M. C. Blum and X. Aymerich: Appl. Phys. Lett.81(2002)3615.

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