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J-GLOBAL ID：200902282054013067   Reference number：05A0996502

Dependence of Microwave Properties of Ba_xSr_1-xTiO₃ Thin Films on Substrate

Ba_xSr_1-xTiO₃薄膜におけるマイクロ波特性の基板依存性

Author (4)： BHAKDISONGKHRAM Gun (Nara Inst. of Sci. and Technol. (NAIST), Nara, JPN) ,  YAMASHITA Youji (Nara Inst. of Sci. and Technol. (NAIST), Nara, JPN) ,  NISHIDA Takashi (Nara Inst. of Sci. and Technol. (NAIST), Nara, JPN) ,  SHIOSAKI Tadashi (Nara Inst. of Sci. and Technol. (NAIST), Nara, JPN)
Material： Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)
Volume： 44  Issue： 9B  Page： 7098-7102  Publication year： Sep. 30, 2005 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： microwave ,...

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JST classification (2)： Oxide thin films  (BK14050P) ,  Transmission lines  (NC04030C)

Reference (10)：

• 1) F. A. Miranda, G. Subramanyam, F. W. Van Keuls, R. R. Romanofsky, J. D. Warner and C. H. Mueller: IEEE Trans. Microwave Theory Tech. 48 (2000) 1181.
• 2) O. Auciello, S. Saha, D. Y. Kaufman, S. K. Streiffer, W. Fan, B. Kabius, J. Im and P. Baumann: J. Electroceramics 12 (2004) 119.
• 3) M. F. Iskander, Z. Zhang, Z. Yun, R. S. Isom, M. G. Hawkins, R. Emrick, B. Bosco, J. Synowczynski and B. Gersten: IEEE Trans. Microwave Theory Tech. 49 (2001) 2547.
• 4) S. Hyun, J. H. Lee, S. S. Kim, K. Char, S. J. Park, J. Sok and H. E. Lee: Appl. Phys. Lett. 77 (2000) 3084.
• 5) H. Lue and T. Tseng: IEEE Trans. Ultrason. Ferroelectr. Freq. Control 48 (2001) 1640.

Terms in the title (3)： 薄膜 ,  マイクロ波特性 ,  依存性