Art
J-GLOBAL ID:200902286205593589   Reference number:05A0521915

Momentum-imaging spectroscopy of secondary ions from GaN and SiC surfaces collided with highly charged ions at grazing angle

多価イオンがかすめ角で衝突したGaNとSiC表面からの二次イオンの運動量画像分光法
Author (3):
Material:
Volume: 232  Issue: 1-4  Page: 254-260  Publication year: May. 2005 
JST Material Number: H0899A  ISSN: 0168-583X  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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JST classification
Category name(code) classified by JST.
Ion emission 

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