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J-GLOBAL ID：200902297182749910   Reference number：06A0655201

Thickness dependence of dielectric properties in bismuth layer-structured dielectrics

ビスマス層状構造誘電体における誘電特性の厚み依存性

Author (9)： TAKAHASHI Kenji (Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN) ,  SUZUKI Muneyasu (Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN) ,  KOJIMA Takashi (Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN) ,  WATANABE Takayuki (Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502 ...) ,  SAKASHITA Yukio (TDK Corp., 570-2 Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, JPN) ,  KATO Kazumi (National Inst. of Advanced Industrial Sci. and Technol., 2266-98 Anagahora, Shimoshidami, Moriyama-ku, Nagoya ...) ,  SAKATA Osami (Materials Sci. Div., Japan Synchrotron Radiation Res. Inst. (JASRI)/SPring-8, Kouto, Mikazuki, Sayo, Hyogo 679-5198, JPN) ,  SUMITANI Kazushi (Materials Sci. Div., Japan Synchrotron Radiation Res. Inst. (JASRI)/SPring-8, Kouto, Mikazuki, Sayo, Hyogo 679-5198, JPN) ,  FUNAKUBO Hiroshi (Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502 ...)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 89  Issue： 8  Page： 082901-082901-3  Publication year： Aug. 21, 2006 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： ferroelectrics ,...

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JST classification (2)： Oxide thin films  (BK14050P) ,  Metal-insulator-metal structures  (BM03087F)

Terms in the title (5)： ビスマス ,  層状構造 ,  誘電体 ,  誘電特性 ,  厚み依存性