Art
J-GLOBAL ID：200902298971158264   Reference number：05A0172426

Investigation of Gross Die Per Wafer Formulas

ウエハ当りのダイ総数公式の研究
Author (1)：
DE VRIES D K

About DE VRIES D K

(Philips Semiconductors, Crolles, FRA)

About Philips Semiconductors, Crolles, FRA


Material：
IEEE Transactions on Semiconductor Manufacturing  (IEEE Trans Semicond Manuf)

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Volume： 18  Issue： 1  Page： 136-139  Publication year： Feb. 2005 
JST Material Number： T0521A  ISSN： 0894-6507  CODEN： ITSMED  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*wafer

About wafer

,...
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JST classification (1)：
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Materials of solid-state devices 
(NC03020K)

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Terms in the title (3)：
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ウエハ

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, 
ダイ

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, 
研究

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