Art

J-GLOBAL ID：201002221573600826   Reference number：10A0295236

A Novel Modeling and Evaluating for RTS Noise on CMOS Image Sensor in Motion Picture

映画のCMOS画像センサに関するRTS雑音用の新しいモデリングと評価

Author (3)： ZHANG Deng (Waseda Univ., Kitakyushu-shi, JPN) ,  RYU Jegoon (Waseda Univ., Kitakyushu-shi, JPN) ,  NISHIMURA Toshihiro (Waseda Univ., Kitakyushu-shi, JPN)
Material： IEICE Transactions on Information and Systems (Institute of Electronics, Information and Communication Engineers)  (IEICE Trans Inf Syst (Inst Electron Inf Commun Eng))
Volume： E93-D  Issue： 2  Page： 350-358  Publication year： Feb. 01, 2010 
JST Material Number： L1371A  ISSN： 0916-8532  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *CMOS structure ,  *image sensor ,  noise generator ,  *modeling ,  noise reduction ,  circuit design ,  image quality ,  *motion picture filming ,  analytical model ,  photodiode ,  PIN diode ,  video camera ,  computer simulation ,  spatial distribution ,  exposure(photography)
Semi thesaurus term： *noise source ,  *quality assessment

JST classification (3)： Graphic and image processing in general  (JE04010I) ,  Operations research in general  (KA03010Q) ,  Numerical computation  (JE02000J)

Reference (31)：

• CARLSON, B. S. Comparison of modern CCD and CMOS image sensor technologies and systems for low resolution imaging. Sensors, Proc. IEEE. 2002, 1, 1, 171-176
• Dalsa Corp. Electronic shuttering for high speed CMOS machine vision applications. Photonik. 2005, 2-4
• KONCZAKOWSKA, A. A new method for RTS noise of semiconductor devices identification. IEEE Trans. Instrum. Meas. 2008, 57, 6, 1199-1206
• LEYRIS, C. Random telegraph signal noise SPICE modeling for circuit simulators. Solid State Device Research Conference, Sept. 2007. 2007, 187-190
• GOUDON, T. On the Shockley-read-hall model : Generation-recombination in semiconductors. www.hyke.org/preprint/2006/01. 2006

Terms in the title (5)： 映画 ,  CMOS画像センサ ,  雑音 ,  モデリング ,  評価