Art
J-GLOBAL ID:201002270223372422   Reference number:10A0883301

SHG Microscopy Excitation with Radially Polarized Beam

最近の偏光計測の動向 ラジアル偏光ビームを用いたSHG顕微計測
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Material:
Volume: 39  Issue:Page: 401-403  Publication year: Aug. 10, 2010 
JST Material Number: G0125B  ISSN: 0389-6625  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Manufacturing technology of solid-state devices 
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