Art

J-GLOBAL ID：201102293504785049   Reference number：11A1241495

Development of quality control system for flat-panel detectors

フラットパネル検出器の品質管理システムの開発

Author (6)： TERAMOTO Atsushi (Fujita Health Univ., Aichi, JPN) ,  KAJIHARA Takahiko (Fujita Health Univ., Aichi, JPN) ,  SUZUKI Shoichi (Fujita Health Univ., Aichi, JPN) ,  KINOSHITA Kazuo (Banbuntane Soutokukai Hospital, Aichi, JPN) ,  TSUZAKA Masatoshi (Nagoya Univ., Aichi, JPN) ,  FUJITA Hiroshi (Gifu Univ., Gifu, JPN)
Material： Radiological Physics and Technology  (Radiol Phys Technol)
Volume： 4  Issue： 2  Page： 164-172  Publication year： Jul. 20, 2011 
JST Material Number： L7250A  ISSN： 1865-0333  Document type： Article
Article type： 解説  Country of issue： Germany, Federal Republic of (DEU)  Language： ENGLISH (EN)

Thesaurus term： *radiation detector ,  X-ray image ,  X-ray detection ,  radiography ,  *quality control ,  administration system ,  pixel
Semi thesaurus term： *flat panel detector

JST classification (1)： Graphic and image processing in general  (JE04010I)

Reference (12)：

• 1. Rowlands J, Kasap S Amorphous semiconductors usher in digital X-ray imaging. Phys Today. 1997:24-30
• 2. Moy JP. Large area X-ray detectors based on amorphous silicon technology. Thin Solid Films. 1999;337:213-21.
• 3. Hopkinson GR. Radiation effects on solid state imaging devices. Radiat Phys chem. 1994;43:79-91.
• 4. Boudry JM, Antonuk LE. Radiation damage of amorphous silicon photodiode sensors. IEEE Trans Nucl Sci. 1994;41:703-7.
• 5. Meng X-T, Kang A-G, Li J-H, Zhang H-Y, Yu S, Zheng Y. Effects of electron and gamma-ray irradiation on CMOS analog image sensors. Microelectron Reliab. 2003;43:1151-5.

Terms in the title (3)： フラットパネル検出器 ,  品質管理システム ,  開発