Art
J-GLOBAL ID：201202206994093724   Reference number：12A1518033

ファンアウトブランチに着目した欠陥検出テスト生成

Author (3)：
KONO HIROSHI

About KONO HIROSHI

(Ehime Univ. Graduate School of Sci. and Engineering)

About Ehime Univ. Graduate School of Sci. and Engineering

, 
HIGAMI YOSHINOBU

About HIGAMI YOSHINOBU

(Ehime Univ. Graduate School of Sci. and Engineering)

About Ehime Univ. Graduate School of Sci. and Engineering

, 
TAKAHASHI HIROSHI

About TAKAHASHI HIROSHI

(Ehime Univ. Graduate School of Sci. and Engineering)

About Ehime Univ. Graduate School of Sci. and Engineering


Material：
電気関係学会四国支部連合大会講演論文集(CD-ROM)  (Shikoku-Section Joint Convention Record of the Institutes of Electrical and Related Engineers (CD-ROM))

About 電気関係学会四国支部連合大会講演論文集(CD-ROM)


Volume： 2012  Page： ROMBUNNO.10-7  Publication year： Sep. 29, 2012 
JST Material Number： L1738B  Document type： Proceedings
Article type： 短報  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
number

About number

, 
branch

About branch

, 
test

About test

, 
delay

About delay

, 
*fault detection

About fault detection

, 
electric fault

About electric fault

, 
test pattern

About test pattern

, 
threshold

About threshold

, 
gate circuit

About gate circuit

, 
cutting

About cutting

, 
circuit

About circuit

, 
*fan out

About fan out

, 
benchmark circuit

About benchmark circuit

, 
breaking of wire

About breaking of wire


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
open fault

About open fault

, 
time delay

About time delay

, 
*test generation

About test generation

, 
transition fault

About transition fault


JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
着目

About 着目

, 
欠陥検出

About 欠陥検出

, 
テスト生成

About テスト生成


Return to Previous Page

TOP

BOTTOM