Art

J-GLOBAL ID：201302202526833348   Reference number：13A0766116

Validation of Sensitive Volume Size based on a Multi-Scale Monte Carlo Simulation in Neutron-Induced Soft Error Analyses

中性子誘起ソフトエラー解析におけるマルチスケールモンテカルロシミュレーションを基にした感応体積サイズの妥当性

Author (2)： ABE Shin-ichiro (Kyushu Univ., JPN) ,  WATANABE Yukinobu (Kyushu Univ., JPN)
Material： 宇宙航空研究開発機構特別資料 JAXA-SP-  (JAXA Special Publication)
Issue： 12-008E  Page： 155-158  Publication year： Mar. 29, 2013 
JST Material Number： S0762C  ISSN： 1349-113X  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： computer simulation ,  *neutron ,  *soft error ,  *MOSFET ,  SEU ,  collection ,  CAD ,  simulator program ,  radiation resistance(radiation effect)
Semi thesaurus term： nMOSFET ,  PHITS ,  TCAD ,  single event upset ,  multiscale simulation ,  cosmic ray neutron ,  charge collection

JST classification (1)： Measurement,testing and reliability of solid-state devices  (NC03040G)

Reference (8)：

• [1] S. Abe et al., "Multi-Scale Monte Carlo Simulation of Soft Errors using PHITS-HyENEXSS code system" IEEE Trans. on Nucl. Sci., vol. 59, pp. 965-970 (2012).
• [2] S. Abe et al., "Neutron-Induced Soft Error Analysis in MOSFETs from a 65nm to a 25nm Design Rule using Multi-Scale Monte Carlo Simulation Method", IEEE Conference publications: in proceedings of International Reliability Physics Symposium 2012, pp. SE.3.1-SE.3.6 (2012).
• [3] Y. Tosaka et al., "Simple Method for Estimating Neutron-Induced Soft Error Rates Based on Modified BGR Model" IEEE Electron Dev. Lett., vol. 20, pp. 89-91 (1999).
• [4] K. M. Warren et al., "Application of RADSAFE to Model the Single Event Upset Response of a 0.25 μm CMOS SRAM", IEEE Trans. on Nucl. Sci., vol. 54, pp. 898-903 (2007).
• [5] Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, JEDEC Standard JESD89A, Oct. 2006 [Online]. Available: http://www.jedec.org

Terms in the title (7)： 中性子 ,  誘起 ,  ソフトエラー ,  解析 ,  体積 ,  サイズ ,  妥当性