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J-GLOBAL ID:201402285381007568   Reference number:14A1099665

大気開放下によるSnO薄膜の作製とその物性評価

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Volume: 75th  Page: ROMBUNNO.19A-A12-8  Publication year: Sep. 01, 2014 
JST Material Number: Y0055B  ISSN: 2758-4704  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Oxide thin films  ,  Electron spectroscopy 
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