Art

J-GLOBAL ID：201502206874261200   Reference number：15A0958849

Phase-contrast scanning transmission electron microscopy

位相コントラスト走査透過電子顕微鏡法

Author (5)： MINODA Hiroki (Tokyo Univ. Agriculture and Technol., Tokyo, JPN) ,  TAMAI Takayuki (Tokyo Univ. Agriculture and Technol., Tokyo, JPN) ,  IIJIMA Hirofumi (JEOL Ltd, Tokyo, JPN) ,  HOSOKAWA Fumio (JEOL Ltd, Tokyo, JPN) ,  KONDO Yukihito (JEOL Ltd, Tokyo, JPN)
Material： Microscopy
Volume： 64  Issue： 3  Page： 181-187  Publication year： Jun. 2015 
JST Material Number： W1384A  ISSN： 2050-5698  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *scanning transmisson electron microscope ,  *electron microscopy ,  *contrast ,  *phase shift ,  phase(topology) ,  biological sample ,  electron wave ,  phase plate ,  incident wave ,  electron scattering ,  transfer function ,  reciprocity theorem ,  *electron microscope
Semi thesaurus term： phase contrast ,  *phase contrast electron microscopy ,  *image contrast

JST classification (2)： Microscopy determination of structures  (BK01040E) ,  Graphic and image processing in general  (JE04010I)

Reference (13)：

• Danev R, Okawara H, Usuda N, Kametani K, Nagayama K (2002) A novel phase-contrast transmission electron microscopy producing high-contrast topographic images of weak objects. J. Biol. Phys. 28: 627-635.
• Huang S-H, Wang W-J, Chang C-S, Hwu Y-K, Tseng F-G, Kai J-J, Chen F-R (2007) The fabrication and application of Zernike electrostatic phase plate. J. Electron Microsc. 55: 273-280.
• Majorovits E, Barton B, Schultheiß K, Pérez-Willard F, Gerthsen D, Schröder R R (2007) Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate. Ultramicroscopy 107: 213-226.
• Cuambie R, Downing K H, Typke D, Glaeser R M, Jin J (2007) Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy. Ultramicroscopy 107: 329-339.
• Matsumoto T, Tonomura A (1996) The phase constancy of electron waves traveling through Boersch's electrostatic phase plate. Ultramicroscopy 63: 5-10.

Terms in the title (2)： 位相コントラスト ,  走査透過電子顕微鏡