Art

J-GLOBAL ID：201702215682481381   Reference number：17A0234371

Non-destructive observations of small crack using scanning laser-induced acoustic microscope

走査式レーザー誘起超音波顕微鏡を使った小亀裂の非破壊観測

Author (6)： KOYAMA Atsuhiro (Division of System Science, Graduate school of Engineering, Nagasaki University) ,  TAKASE Toru (Division of System Science, Graduate school of Engineering, Nagasaki University) ,  MOTOMURA Fumitaka (Division of System Science, Graduate school of Engineering, Nagasaki University) ,  KOGA Hiroki (Graduate school of Engineering, Nagasaki University) ,  RYU Satoshi (Graduate school of Engineering, Nagasaki University) ,  SHIBUTANI Yoji (Department of Mechanical Engineering, Osaka University)
Material： Mechanical Engineering Journal (Web)  (Mech Eng J (Web))
Volume： 3  Issue： 6  Page： 16-00147(J-STAGE)  Publication year： 2016 
JST Material Number： U0484A  ISSN： 2187-9745  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *laser irradiation ,  *ultrasonic microscope ,  *optical scanning ,  *microcrack ,  *nondestructive inspection ,  thermal stress ,  function generation ,  amplifier ,  acoustic emission ,  sensor ,  AE inspection ,  positioning device ,  *thermal wave ,  *acoustic image ,  *aluminum base alloy ,  *flaw inspection ,  *Microscopy ,  laser output ,  function generator ,  X-Y stage ,  A6063 ,  acoustic emission sensor
Semi thesaurus term： fatigue crack ,  lock-in amplifier ,  AE sensor

Author keywords (5)： Scanning laser-induced acoustic microscope ,  Non-destructive observation ,  Crack ,  Thermal stress wave ,  Acoustic wave

JST classification (2)： Metallic material testing in general  (HB02010J) ,  Other applications of acoustics  (BB03100I)

Reference (14)：

• Ameri, S., Ash, E.A., Neuman, V. and Petts, C. R., Photo-displacement imaging, Electronics Letters, Vol.17, No.10 (1981), p. 337-338.
• Boccara, A. C., Fournier, D. and Badoz, J., Thermo-optical spectroscopy: Detection by the “mirage effect”, Applied Physics Letters, Vol.36, Issue 2 (1980), pp.130-132.
• Brandis, E. and Rosencwaig, A., Thermal-wave microscopy with electron beams, Applied Physics Letters, Vol.37, Issue 1 (1980), pp.98-100.
• Cargill, G. S. III, Ultrasonic imaging in scanning electron microscope, Nature, 286 (1980), pp.691-693.
• Grice, K. R., Inglehart, L. J., Favro, L. D., Kuo, P. K. and Thomas, R. L., Thermal wave imaging of closed cracks in opaque solids, Journal of Applied Physics, Vol.54, No.11 (1983), pp.6245-6255.

Terms in the title (5)： 走査式 ,  レーザー誘起 ,  超音波顕微鏡 ,  亀裂 ,  観測