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J-GLOBAL ID:201702275369952589   Reference number:17A1141838

ミストCVD法によるサファイア基板上のα-Ga2O3薄膜成長の条件検討

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Material:
Volume: 78th  Page: ROMBUNNO.8a-PA4-26  Publication year: Aug. 25, 2017 
JST Material Number: Y0055B  ISSN: 2758-4704  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Semiconductor thin films 
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