2019 - 2022 Development of fundamental technologies for fabrication of ultra-high voltage aluminum nitride semiconductor devices
Papers (76):
Hiroshi Fujioka, Kohei Ueno. Characteristics of group III-nitride films prepared by pulsed sputtering. Gallium Nitride Materials and Devices XIX. 2024
Yoshihiro Ishitani, Bojin Lin, Hnin Lai Lai Aye, Daiki Yoshikawa, Hideto Miyake, Kohei Ueno, Hiroshi Fujioka. Longitudinal optical (LO) and LO-like phonon resonant mid-infrared radiation emission and absorption by surface micro-structures on III-nitrides. Gallium Nitride Materials and Devices XIX. 2024
Ryota Maeda, Kohei Ueno, Atsushi Kobayashi, Hiroshi Fujioka. Temperature-Dependent Characteristics of AlN/Al0.5Ga0.5N High Electron Mobility Transistors with Highly Degenerate n-Type GaN Regrown Ohmic Contacts. physica status solidi (a). 2024
Aiko Naito, Kohei Ueno, Atsushi Kobayashi, Hiroshi Fujioka. Hole Conduction Mechanism in In-Mg-Codoped GaN Prepared via Pulsed Sputtering Deposition. Physica Status Solidi (A) Applications and Materials Science. 2024
Ryota Maeda, Kohei Ueno, Hiroshi Fujioka. Pulsed sputtering selective epitaxial formation of highly degenerate n-type GaN ohmic contacts for GaN HEMT applications. Applied Physics Express. 2024. 17. 1. 011006-011006