Art

J-GLOBAL ID：201802213352941267   Reference number：18A1417136

Using Scattered X-Rays to Improve the Estimation Accuracy of Attenuation Coefficients: A Fundamental Analysis

散乱X線を用いた減衰係数の推定精度の向上:基礎的解析

Author (5)： TODA Naohiro (School of Information Science and Technology, Aichi Prefectural University) ,  NAKAGAMI Tetsuya (Technical Resources Department, DENSO CREATE INC.) ,  YAMAZAKI Yoichi (School of Science and Technology/Research Center for Kansei Value Creation, Kwansei Gakuin University) ,  YOSHIOKA Hiroki (School of Information Science and Technology, Aichi Prefectural University) ,  KOYAMA Shuji (Brain and Mind Research Center, Nagoya University)
Material： IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (Web)  (IEICE Trans Fundam Electron Commun Comput Sci (Web))
Volume： E101.A  Issue： 7  Page： 1101-1114(J-STAGE)  Publication year： 2018 
JST Material Number： U0466A  ISSN： 1745-1337  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *X-ray scattering ,...
Semi thesaurus term： computed tomography ,...

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Author keywords (5)： X-ray CT ,  scattered X-rays ,  accuracy ,  Monte Carlo simulation ,  Cramer-Rao lower bound

JST classification (2)： Medical image processing  (JE04020T) ,  Computer simulation  (JE11000H)

Reference (30)：

• [1] J. Hsieh, Computed Tomography: Principles, Design, Artifacts and Recent Advances, SPIE Press, Bellingham, 2003. 10.1117/3.2197756
• [2] H. Kanamori, N. Nakamori, K. Inoue, and E. Takenaka, “Effects of scattered x-rays on CT images,” Phys. Med. Biol., vol.30, no.3, pp.239-249, 1985. 10.1088/0031-9155/30/3/004
• [3] K. Tokumoto, Y. Yamazaki, N. Toda, and S. Koyama, “Evaluation of scattered radiation in cone-beam dual-energy X-ray CT with Monte Carlo simulation,” The Radiological Society of North America (RSNA) 98th Scientific Assembly and Annual Meeting, pp.SSG16-02, 2012.
• [4] Y. Kyriakou and W. Kalender, “Efficiency of antiscatter grids for flat-detector CT,” Phys. Med. Biol., vol.52, no.20, pp.6275-6293, 2007. 10.1088/0031-9155/52/20/013
• [5] H. Gao, J. Boudry, A. Cohen, Y. Imai, and R. Melnyk, “Revolution CT: Overcoming wide coverage IQ challenges,” White Paper, 2014.

Terms in the title (4)： 減衰係数 ,  推定精度 ,  基礎 ,  解析