Art

J-GLOBAL ID：201802225147827454   Reference number：18A0091753

Estimation of hole injection barrier at the poly-3(hexylthiophene)/metal interface using accumulated charge measurement

蓄積電荷測定を用いたポリ-3(ヘキシルチオフェン)/金属界面における正孔注入障壁の推定【Powered by NICT】

Author (6)： Tajima Hiroyuki (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan) ,  Yasukawa Naoto (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan) ,  Nakatani Hisaki (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan) ,  Sato Seiichi (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan) ,  Kadoya Tomofumi (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan) ,  Yamada Jun-ichi (Graduate School of Material Science, University of Hyogo, 3-2-1 Kohto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan)
Material： Organic Electronics  (Org Electron)
Volume： 51  Page： 162-167  Publication year： 2017 
JST Material Number： W1352A  ISSN： 1566-1199  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Hole injection barriers at the...

Register(free) or Log In to access     To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=18A0091753&from=J-GLOBAL&jstjournalNo=W1352A") }}

Thesaurus term： *electric charge ,  work function ,  ohmic contact ,  ionization potential ,  Copper ,  *interface (surface) ,  Silver ,  ultra high vacuum ,  metal electrode ,  Schottky contact ,  thermal annealing ,  regioregularity ,  *hole injection ,  *charge measurement

Author keywords (6)： Injection barrier ,  Accumulated charge measurement ,  ACM ,  Ionization energy ,  Poly-3(hexylthiophene) ,  P3HT

JST classification (2)： Physical properties of polymer solids  (CG02024U) ,  Electric conduction in organic compounds  (BM03045F)

Terms in the title (6)： 蓄積 ,  電荷測定 ,  界面 ,  正孔注入 ,  障壁 ,  推定