Research field (1)：
Thin-film surfaces and interfaces
Research keywords (4)：
field emission
, nano mechanics
, scanning probe microscope
, Surface Science
Research theme for competitive and other funds (36)：
2022 - 2025 ナノ力学に基づく探針振動同期励起による原子レベルの赤外分光
2021 - 2024 周波数変調/同期法を利用したナノ力学による原子レベルの顕微鏡/分光法の開拓
2018 - 2022 Nanoscale mechanical analysis of nanocontacts using combined scanning probe microscopy capable of detection of energy dissipation
2015 - 2018 A study of mechanical property of clean metal atomic contacts by UHV-TEM-AFM method
2014 - 2017 Measurements of the charge state of a molecule on a solid substrate on the basis of scanning probe microscopy
2012 - 2016 Analysis and fabrication of nanoscale contacts and interfaces by scanning probe microscopy technology
2010 - 2012 In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPM
2008 - 2011 Atomic force spectroscopy of chemical bonding process with bias voltage tuning between a tip and a sample
2008 - 2011 Analysis of binding formation between solid surfaces by bias voltage non-contact atomic force microscopy/spectroscopy
2008 - 2011 Characterization of conjugated molecule monolayer chemically bonded on semiconductor surface and its application to single molecular light emitting devices
2006 - 2007 シリコン表面に化学結合した共役系分子の電気伝導
2005 - 2007 Mechanical and electronic measurements based on scanning probe microscopy for single molecules on surfaces using electron resonant interaction
2005 - 2007 Measurements of electronic properties of interfaces with functional nanostructures by bias-voltage non-contact atomic force microscopy/spectroscopy
2003 - 2004 走査型プローブ顕微鏡によるDNA分子の半導体表面ステップへの特異吸着の研究
2000 - 2002 Study of electric field close to a sample surface utilizing the electron standing wave excited in a vacuum gap of scanning tunneling microscopy
1999 - 2002 超高分解能原子間力プローブ法による原子の力学的分光と制御
1999 - 2000 エネルギーフィルター電界放射顕微鏡による表面吸着電子状態解析の試み
1998 - 2000 Development of a field electron emission-scanning probe microscope with a build-up tip
1997 - 1998 ナノスケール探針のシャドー効果による光・電子照射測定の空間分解能向上の試み
1995 - 1997 Recognition of atomic species on hetero-surfaces by atom resolved tunneling spectroscopy
1993 - 1996 Tunneling Characteristics in Atomic Resolution
1993 - 1995 Construction of an experimental apparatus for atom transfer between nano-regions
1993 - 1993 STM/STSによる半導体微粒子の研究
1992 - 1993 Microscopic Study of Si-Ge Heteroepitaxial Growth by STM/STS
1992 - 1993 Schottrey barrier height of epitaxial interface studied by UHV-electron microscope
1990 - 1992 Construction of Scanning Tunneling Microscope for the Study of Interacting Biological Molecualr Systems and their Preparation
1990 - 1991 Development of Field Emission Type Ultra-High Vacuum Gauge
1990 - 1991 Development of Preparation Methods of SXM Tips with a Ultra-fine Probing Area
1990 - 1990 超高真空STM/STSによる化合物半導体表面の内因性欠陥の研究
1989 - 1990 Ultra-Fine Surface Analysis by a Combined Instrument of an STM and A-P
1989 - 1989 走査型トンネル電子分光による金属-半導体界面の形成過程の研究
1989 - 1989 原子プローブ:レーザー誘起電界蒸発等による表面研究
1987 - 1989 原子プローブ:レーザー誘起電界蒸発などによる表面研究
1987 - 1987 原子プローブ:レーザー誘起電界蒸発などによる表面研究
1986 - 1987 Ultramicroanalysis of Conducting Polymers with Atom-Probe
Takashi Nishimura, Masahiko Tomitori. In situ observation of formation of Si protrusions by local melting of a Si narrow current path using resistive heating together with electron beam irradiation. Japanese Journal of Applied Physics. 2022. 61. 6. 065508-1-065508-7
Md Mahamudul Hasan, Toyoko Arai, Masahiko TOMITORI. Mechanical energy dissipation of an oscillating cantilever close to a conductive substrate partly covered with thin mica films evaluated by frequency modulation atomic force microscopy. Japanese Journal of Applied Physics. 2022. 61. 6. 065006-1-065006-12
Takashi Nishimura, Masahiko Tomitori. Fabrication of Si protrusions by local melting of a narrow current path on a Si wafer via resistive heating. Japanese Journal of Applied Physics. 2021. 60. 126506
Non-contact evaluation of surface resistivity using frequency modulation atomic force microscopy
(The 22nd International Vacuum Congress 2022)
Surface resistivity evaluated by frequency modulation atomic force microscopy through Joule heat energy dissipation
(23rd International Conference on non-contact atomic force microscopy 2022)
水晶振動子を組み込んだ TEM 法による金ナノコンタクト臨界せ ん断応力の計測
(ISSP workshop “Frontier of scanning probe microscopy and related nano science” 2022)
Measurement of critical shear stress of gold nanocontacts by in-situ transmission electron microscopy equipped with a quartz resonator
(The Material Research Meeting 2021 (MRM2021) 2021)
THE JAPAN INSTITUTE OF METALS AND MATERIALS
, THE JAPANESE SOCIETY OF MICROSCOPY
, The Japan Society of Vacuum and Surface Science
, THE PHYSICAL SOCIETY OF JAPAN
, THE JAPAN SOCIETY OF APPLIED PHYSICS
