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J-GLOBAL ID：201902261686633567   Reference number：19A0898877

Reliability Evaluation of SiC Power Module With Sintered Ag Die Attach and Stress-Relaxation Structure

焼結Agダイアタッチと応力緩和構造を持つSiCパワーモジュールの信頼性評価【JST・京大機械翻訳】

Author (7)： Sugiura Kazuhiko (Electronics Research and Innovation Division, DENSO CORPORATION, Nisshin, Japan) ,  Iwashige Tomohito (Electronics Research and Innovation Division, DENSO CORPORATION, Nisshin, Japan) ,  Tsuruta Kazuhiro (Electronics Research and Innovation Division, DENSO CORPORATION, Nisshin, Japan) ,  Chen Chuantong (Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Japan) ,  Nagao Shijo (Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Japan) ,  Funaki Tsuyoshi (Division of Electric, Electronics and Information Engineering, Graduate School of Engineering, Osaka University, Suita, Japan) ,  Suganuma Katsuaki (Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Japan)
Material： IEEE Transactions on Components, Packaging, and Manufacturing Technology  (IEEE Trans Compon Packag Manuf Technol)
Volume： 9  Issue： 4  Page： 609-615  Publication year： 2019 
JST Material Number： W0590B  ISSN： 2156-3950  CODEN： ITCPC8  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Silicon carbide (SiC) power mo...

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Thesaurus term： *silver ,  substrate(plate) ,  scanning electron microscope ,  *sintering ,  high temperature ,  *silicon carbide ,  thermal stress ,  durability ,  computer simulation ,  electric power ,  prototype ,  adhesion(surface chemistry) ,  stress distribution ,  *stress relaxation ,  crack
Semi thesaurus term： *パワーモジュール , 【Automatic Indexing@JST】

JST classification (5)： Hydrid integrated circuit  (NC03163K) ,  Semiconductor lasers  (BD04070L) ,  Manufacturing technology of solid-state devices  (NC03030V) ,  Light emitting devices  (NC03082G) ,  Heating  (PA03040C)

Terms in the title (7)： 焼結 ,  Ag ,  ダイアタッチ ,  応力緩和 ,  SiC ,  パワーモジュール ,  信頼性評価