Art
J-GLOBAL ID:201902263885412319   Reference number:19A2613368

Black silicon - correlation between microstructure and Raman scattering

ブラックシリコン-微細構造とRaman散乱との相関【JST・京大機械翻訳】
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Volume: 70  Issue:Page: 58-64  Publication year: 2019 
JST Material Number: U8048A  ISSN: 1339-309X  Document type: Article
Article type: 原著論文  Country of issue: Germany, Federal Republic of (DEU)  Language: ENGLISH (EN)
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Abstract: Black silicon layers...
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Manufacturing technology of solid-state devices  ,  Thin films of other inorganic compounds  ,  Infrared spectra,Raman scattering and Raman spectra in general  ,  Materials of solid-state devices 
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