Art
J-GLOBAL ID:201902265016276850   Reference number:19A2268992

Electron-beam enhanced creep deformation of amorphous silicon nano-cantilever

非晶質シリコンナノカンチレバーのElectronビーム強化クリープ変形【JST・京大機械翻訳】
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Material:
Volume: 126  Issue: 10  Page: 105102-105102-10  Publication year: 2019 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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To investigate the creep prope...
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Lattice defects in semiconductors  ,  Semiconductor-metal contacts  ,  Irradiational changes semiconductors 
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