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J-GLOBAL ID：201902284337645332   Reference number：19A1932893

Late Breakdowns Caused by Microparticles After Vacuum Arc Interruption

真空アーク遮断後の微粒子によって引き起こされた後期ブレークダウン【JST・京大機械翻訳】

Author (8)： Ejiri Haruki (Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan) ,  Kumada Akiko (Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan) ,  Hidaka Kunihiko (Department of Electrical Engineering and Information Systems, The University of Tokyo, Tokyo, Japan) ,  Taguchi Yuki (Division of Mathematics, Electronics and Information Sciences, Saitama University, Saitama, Japan) ,  Inada Yuki (Division of Mathematics, Electronics and Information Sciences, Saitama University, Saitama, Japan) ,  Yamano Yasushi (Division of Mathematics, Electronics and Information Sciences, Saitama University, Saitama, Japan) ,  Iwabuchi Hiroyuki (Division of Intelligent Systems Engineering, Yokohama National University, Yokohama, Japan) ,  Kaneko Eiji (Department of Electrical and Electronics Engineering, University of the Ryukyus, Nishihara, Japan)
Material： IEEE Transactions on Plasma Science  (IEEE Trans Plasma Sci)
Volume： 47  Issue： 8  Page： 3392-3399  Publication year： 2019 
JST Material Number： D0036B  ISSN： 0093-3813  CODEN： ITPSBD  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： In vacuum circuit breakers, re...

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Thesaurus term： *vacuum arc ,  scanning electron microscope ,  vacuum circuit breaker ,  carbonization (chemical reaction) ,  anode ,  particle size (ratio) ,  micro structure ,  pulsed laser ,  field emission ,  *fine particle ,  shadowgraph ,  recovery voltage ,  particle bombardment
Semi thesaurus term： 電流遮断 ,  *遮断 , 【Automatic Indexing@JST】

JST classification (3)： Gas discharges  (BJ03020T) ,  Switchgears  (NB09030I) ,  Discharge devices  (BJ03040P)

Terms in the title (4)： 真空アーク ,  遮断 ,  微粒子 ,  ブレークダウン