Art

J-GLOBAL ID：202002226372242207   Reference number：20A2710161

Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene

低密度ポリエチレンを用いたX線光電子分光法装置の強度キャリブレーションに関する先進材料および標準研究室間研究に関するVersaillesプロジェクト【JST・京大機械翻訳】

Author (51)： Reed Benjamen P. (National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom) ,  Cant David J. H. (National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom) ,  Spencer Steve J. (National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom) ,  Carmona-Carmona Abraham Jorge (CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico) ,  Bushell Adam (Thermo Fisher Scientific (Surface Analysis), East Grinstead RH19 1XZ, United Kingdom) ,  Herrera-Gomez Alberto (CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico) ,  Kurokawa Akira (National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan) ,  Thissen Andreas (SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany) ,  Thomas Andrew G. (School of Materials, Photon Science Institute and Sir Henry Royce Institute, Alan Turing Building, University of Manchester, Oxford Road, Manchester M13 9PL, United Kingdom) ,  Britton Andrew J. (Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom) ,  Bernasik Andrzej (Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland) ,  Fuchs Anne (Robert Bosch GmbH, Robert-Bosch-Campus, 71272 Renningen, Germany) ,  Baddorf Arthur P. (Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830) ,  Bock Bernd (Tascon GmbH, Mendelstr. 17, D-48149 Muenster, Germany) ,  Theilacker Bill (Medtronic, 710 Medtronic Parkway, LT240, Fridley, Minnesota 55432) ,  Cheng Bin (Analysis and Testing Center, Beijing University of Chemical Technology, Beijing 100029, People’s Republic of China) ,  Castner David G. (National ESCA and Surface Analysis Center for Biomedical Problems, Department of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195) ,  Morgan David J. (Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Main Building, Cardiff CF10 3AT, United Kingdom) ,  Valley David (Physical Electronics Inc., East Chanhassen, Minnesota 55317) ,  Willneff Elizabeth A. (Versatile X-ray Spectroscopy Facility, School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom) ,  Smith Emily F. (Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham NG7 2RD, United Kingdom) ,  Nolot Emmanuel (CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France) ,  Xie Fangyan (Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People’s Republic of China) ,  Zorn Gilad (GE Research, 1 Research Circle, K1 1D7A, Niskayuna, New York 12309) ,  Smith Graham C. (Faculty of Science and Engineering, University of Chester, Thornton Science Park, Chester CH2 4NU, United Kingdom) ,  Yasufuku Hideyuki (Materials Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0044, Japan) ,  Fenton Jeffery L. (Medtronic, 6700 Shingle Creek Parkway, Brooklyn Center, Minnesota 55430) ,  Chen Jian (Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People’s Republic of China) ,  Counsell Jonathan D. P. (Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom) ,  Radnik Jorg (Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany) ,  Gaskell Karen J. (Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742) ,  Artyushkova Kateryna (Physical Electronics Inc., East Chanhassen, Minnesota 55317) ,  Yang Li (Department of Chemistry, Xi’an Jiaotong-Liverpool University, 111 Ren’ai Road, Suzhou Dushu Lake Science and Education Innovation District, Suzhou Industrial Park, Suzhou 215123, People’s Republic of China) ,  Zhang Lulu (National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan) ,  Eguchi Makiho (Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan) ,  Walker Marc (Department of Physics, University of Warwick, Coventry, West Midlands CV4 7AL, United Kingdom) ,  Hajdyla Mariusz (Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland) ,  Marzec Mateusz M. (Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland) ,  Linford Matthew R. (Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602) ,  Kubota Naoyoshi (Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan) ,  Cortazar-Martinez Orlando (CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico) ,  Dietrich Paul (SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany) ,  Satoh Riki (Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan) ,  Schroeder Sven L. M. (Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom) ,  Avval Tahereh G. (Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602) ,  Nagatomi Takaharu (Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan) ,  Fernandez Vincent (Universite de Nantes, CNRS, Institut des Materiaux Jean Rouxel, IMN, F-44000 Nantes, France) ,  Lake Wayne (Atomic Weapons Establishment (AWE), Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom) ,  Azuma Yasushi (National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan) ,  Yoshikawa Yusuke (Material Analysis Department, Yazaki Research and Technology Center, Yazaki Corporation, 1500 Mishuku, Susono-city, Shizuoka 410-1194, Japan) ,  Shard Alexander G. (National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom)
Material： Journal of Vacuum Science & Technology. A. Vacuum, Surfaces and Films  (Journal of Vacuum Science and Technology. A. Vacuum, Surfaces, and Films)
Volume： 38  Issue： 6  Page： 063208-063208-15  Publication year： 2020 
JST Material Number： C0789B  ISSN： 0734-2101  CODEN： JVTAD6  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： We report the results of a Ver...

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Thesaurus term： noise(signal) ,  radiation source ,  transfer function ,  monochromator ,  gold ,  silver ,  copper ,  spectrum ,  international standard ,  warming up ,  sample preparation ,  producer ,  spectrometer(optical) ,  *X-ray photoelectron spectroscopy
Semi thesaurus term： 水晶 , 【Automatic Indexing@JST】

JST classification (2)： Electron spectroscopy  (BM09060K) ,  Vacuum production and techniques  (BA02020L)

Terms in the title (7)： 低密度ポリエチレン ,  X線光電子分光法 ,  キャリブレーション ,  先進材料 ,  標準 ,  研究 ,  プロジェクト