Art

J-GLOBAL ID：202002250687382149   Reference number：20A1230844

Relation between Sample Area and Accuracy of STM: What Causes the Difficulty in Quantitative Elemental Analysis?

STMの試料面積と精度の関係: 定量的元素分析における困難さの原因

Author (6)： Tanaka Ryohei (Department of Materials Science and Engineering, Kyoto University) ,  Kishimoto Tetsuya (Department of Materials Science and Engineering, Kyoto University) ,  Yoshimura Takayuki (Department of Materials Science and Engineering, Kyoto University) ,  Kurokawa Shu (Department of Materials Science and Engineering, Kyoto University) ,  Sakai Akira (Department of Materials Science and Engineering, Kyoto University) ,  Kawai Jun (Department of Materials Science and Engineering, Kyoto University)
Material： e-Journal of Surface Science and Nanotechnology (Web)  (表面科学とナノテクノロジー)
Volume： 18  Page： 28-31(J-STAGE)  Publication year： 2020 
JST Material Number： U0016A  ISSN： 1348-0391  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *scanning tunneling microscope ,  resolving power ,  *elemental analysis ,  quantitative analysis (analytical chemistry) ,  *sampling ,  measurement accuracy ,  simulation ,  Monte Carlo Method ,  ICP-AES analysis ,  X-ray fluorescence analysis ,  total reflection ,  atomic force microscope ,  scanning probe microscope ,  Monte Carlo simulation ,  Numerical Simulation ,  total reflection X-ray fluorescence
Semi thesaurus term： AFM (microscope) ,  scanning probe microscope ,  STM (microscope) ,  TXRF ,  sampling ,  atomic resolution ,  ICP-AES

Author keywords (5)： Atomic resolution microscopes ,  Quantitative elemental analysis ,  STM ,  AFM ,  TXRF

JST classification (2)： Microscopy determination of structures  (BK01040E) ,  Analytical instruments  (CC02020S)

Reference (14)：

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• [2] C.-U. Ro, S. Hoornaert, and R. Van Grieken, Anal. Chim. Acta 389, 151 (1999).
• [3] V. Ya. Borkhodoev, X-Ray Spectrom. 39, 28 (2010).
• [4] P. J. Potts, A. G. Tindle, and M. C. Isaacs, Am. Mineral. 68, 1237 (1983).
• [5] A. P. Marques, M. C. Freitas, H. Th. Wolterbeek, T. G. Verburg, and J. J. M. De Goeij, Nucl. Instrum. Methods Phys. Res. B 255, 380 (2007).

Terms in the title (7)： STM ,  試料 ,  面積 ,  定量 ,  元素分析 ,  困難さ ,  原因