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J-GLOBAL ID:200902015580196631   Reference number:92A0363837

1H Nuclear Magnetic Resonance Study of Hydrogenated Amorphous Silicon Deposited from a Xe-diluted Silane Plasma.

Xe希釈シランプラズマから堆積した非晶質水素化けい素の1H核磁気共鳴研究
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Volume: 31  Issue:Page: 989-994  Publication year: Apr. 1992 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semiconductor thin films 

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