Electrical Characteristics of Rare Earth (La, Ce, Pr and Tm) Oxides/Silicates Gate Dielectric
(China Semiconductor Technology International Conference 2010)
Fabrication of SB-MOSFETs on SOI Substrate Using Ni Silicide Containing Er Interlayer
(China Semiconductor Technology International Conference 2010)
Performance of Silicon Ballistic Nanowire MOSFET with Diverse Orientations and Diameters
(China Semiconductor Technology International Conference 2010)
Depth Profiling of Chemical Bonding States of Impurity Atoms and Their Correlation with Electrical Activity in Si Shallow Junctions
(IEEE IWJT 2010 Extended Abstracts 2010 International Workshop on Junction Technology 2010)
Vacancy-Type Defects in Ultra-Shallow Junctions Fabricated Using Plasma Doping Studied by Positron Annihilation
(IEEE IWJT 2010 Extended Abstracts 2010 International Workshop on Junction Technology 2010)