Yoshikazu Fujii. Recent Developments in the X-ray Reflectivity Analysis. American Journal of Physics and Applications. 2016. 4. 2. 27-49
Yoshikazu Fujii. Recent Developments in the X-Ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials. Journal of Materials. 2013. Article ID 678361. 2013. 1-20
Top 5 Contributions in Materials Science (Chapter 2: Recent Developments in the X-ray Reflectivity Analysis for Rough Surfaces and Interfaces of Multilayered Thin Film Materials)
Avid Science 2019
X-Ray Scattering
Nova Science Publishers, Inc. 2011
表面・界面分析の基礎と応用
日本表面科学会 2009
表面・界面分析の基礎と応用
日本表面科学会 2008
講演・口頭発表等 (30件):
チタン合金の液体分離
(日本学術振興会合金状態図172委員会・第34回研究会 2018)
New investigation method on surface roughness correlation function with the use of X-ray reflectivity
(11th International Symposium on Atomic Level Characterizations for New Materials and Devices ’17 2017)
Microstructure of Ti-Nb-Ag Immiscible Alloys with Liquid Phase Separation
(60th Memorial Symposium of the Japanese Society of Microscopy 2017)
Analysis of the Surface Roughness Correlation Function by X-ray Reflectivity
(7th International Symposium on Control of Semiconductor Interfaces 2016)
Analysis of surface roughness correlation function by X-ray reflectivity
(10th International Symposium on Atomic Level Characterizations for New Materials and Devices ’15 2015)