Research field (5):
Inorganic materials
, Electronic devices and equipment
, Quantum beam science
, Thin-film surfaces and interfaces
, Analytical chemistry
Research keywords (7):
Surface Analysis
, Focused Ion Beam
, Vacuum and Surface Science
, Water cluster ion beam
, Secondary ion mass spectrometry
, Mass analyzer
, Micro beam analysis
日本学術振興会R026先端計測技術の将来設計委員会
, 総合研究機構フォーラム2008
, 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '09
, 8th International Symposium on Atomic Level Characterizations for New Materials and Devices '09
, 7th International Symposium on Atomic Level Characterizations for New Materials and Devices '09
, 16th international conference on secondary ion mass spectrometry
, The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-13)
, The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12)
, The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-11)
, The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-10)
, 日本表面科学会
, 6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07
, 総合研究機構フォーラム
, The Japan Society of Analytical Chemistry
, The Japan Society of Vacuum and Surface Science
, The chemical society of Japan
, The 141th Committee on Microbeam Analysis of Japan Society for the Promotion of Scienc