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J-GLOBAL ID：201401036588540955   Update date: Sep. 01, 2024

Fukumoto Satoshi

フクモト サトシ | Fukumoto Satoshi
Affiliation and department：
Tokyo Metropolitan University

About Tokyo Metropolitan University


Homepage URL  (1)： http://kaken.nii.ac.jp/d/r/50247590.ja.html
Research field  (2)： Information networks ,  Computer systems
Research keywords  (30)： ロールバックリカバリ ,  分散チェックポインティング ,  分散システム ,  非連携チェックポインティング ,  組み込み自己テスト ,  ツリークォーラム ,  高電磁環境 ,  連携チェックポインティング ,  チェックポイント ,  ソフトエラー ,  SoC ,  時空間冗長プロセッサ ,  時間冗長プロセッサ ,  SAN ,  SANINAS ,  同時多重故障 ,  確率モデル ,  クォーラム ,  NAS ,  障害回復 ,  分散データベース ,  並列システム ,  データ複製プロトコル ,  性能評価尺度 ,  フルバックアップ ,  電磁波 ,  分散アルゴリズム ,  FPGA ,  畳込み符号 ,  故障モデル
Papers (60)：
  • Yoshikazu Nagamura, Koji Arima, Masayuki Arai, Satoshi Fukumoto. Layout Feature Extraction Using CNN Classification in Root Cause Analysis of LSI Defects. IEEE Transactions on Semiconductor Manufacturing. 2021. 34. 2. 153-160
  • Yoshikazu Nagamura, Takashi Ide, Masayuki Arai, Satoshi Fukumoto. CNN-Based Layout Segment Classification for Analysis of Layout-Induced Failures. IEEE Transactions on Semiconductor Manufacturing. 2020. 33. 4. 597-605
  • Ryohei Sato, Satoshi Fukumoto. Response-Time Analysis for Controller Area Networks With Randomly Occurring Messages. IEEE Transactions on Vehicular Technology. 2020. 69. 4. 3893-3902
  • Yudai Komori, Kazuya Sakai, Satoshi Fukumoto. Fast and secure tag authentication in large-scale RFID systems using skip graphs. Computer Communications. 2018. 116. 77-89
  • Yudai Komori, Kazuya Sakai, Satoshi Fukumoto. RFID Tag Grouping Protocols Made Private. Proceedings - 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2017. 2017. 105-106
ｍore...
MISC (16)：
  • A Study of Randomized Skip Graph-Based Authentication for Large-Scale RFID Systems. 2016. 116. 20. 1-6
  • IMAI Kenta, SAYSANASONGKHAM Aromhack, ARAI Masayuki, FUKUMOTO Satoshi, WADA Keiji. An Approach to Highly Reliable Scheme for a Digital Power Control. IEICE technical report. Computer systems. 2013. 113. 21. 1-6
  • Nagashima Kazuma, Imai Kenta, Arai Masayuki, Fukumoto Satoshi, Wada Keiji. C-025 Experimental Evaluation of Transient Faults on Logic Circuit in Highly Electromagnetic Environments. 2012. 11. 1. 317-318
  • Fukumoto Satoshi, Kurokawa Harunobu, Arai Masayuki, Iwasaki Kazuhiko. C_017 On the Distribution of a Residual Faults Number in VLSI Random Pattern Testing. 2006. 5. 1. 195-196
  • Ohara Mamoru, Arai Masayuki, Fukumoto Satoshi, Iwasaki Kazuhiko. C-030 On the Optimal Checkpoint Interval in Uncoordinated Checkpointing with Bound Rolbacks. 2005. 4. 1. 249-250
ｍore...
Books (1)：
  • コンピュータアーキテクチャ 第2版
    朝倉書店 2015
Work history (1)：
  • 2010/04 - Tokyo Metropolitan University Faculty of System Design
※ Researcher’s information displayed in J-GLOBAL is based on the information registered in researchmap. For details, see here.

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