Research field (5):
Semiconductors, optical and atomic physics
, Thin-film surfaces and interfaces
, Electronic devices and equipment
, Electric/electronic material engineering
, Applied materials
Research keywords (4):
solar cells
, thin film battery
, organic electronics
, energy harvesting
Research theme for competitive and other funds (2):
2014 - 2017 Development of composite device of flexible thin film secondary battery/solar cell for energy harvesting
2010 - 2012 Developments of CFRP structures with electricity storagepotential
Papers (53):
K. Morita, B. Tsuchiya, R. Ye, H. Tsuchida, T. Majima. Li depth analysis of Au/LiMn2O4/LATP/Ge/(Au and Al) by means of ERD and RBS techniques with MeV O4+ ion beams. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2024. 554. 165429-165429
K. Morita, B. Tsuchiya, R. Ye, H. Tsuchida, T. Majima. Dynamic behavior of Li depth profiles in solid state Li ion battery under charging and discharging by means of ERD and RBS techniques. Solid State Ionics. 2021. 370
Vairavel Mathayan, Kenji Morita, Bun Tsuchiya, Rongbin Ye, Mamoru Baba, Marcos V. Moro, Daniel Primetzhofer. Assessing the potential of ion beam analytical techniques for depth profiling Li in thin film Li ion batteries. Journal of Applied Physics. 2021. 130. 12
Yu Konno, Ryota Osuga, Junko N. Kondo, Rongbin Ye, Tadashi Tsukamoto, Yoshiyuki Oishi, Yuji Shibasaki. Highly thermostable high molecular-weight low k PIM polymers based on 5,5′,6,6′-tetrahydroxy-3,3,3′,3′-Tetramethylspirobisindane, decafluorobiphenyl, and bisphenols. Polymer. 2021. 230
Vairavel Mathayan, Kenji Morita, Bun Tsuchiya, Rongbin Ye, Mamoru Baba, Daniel Primetzhofer. Sensitive in-operando observation of Li and O transport in thin-film Li-ion batteries. Materials Today Energy. 2021. 21
Fukunori Izumida, Rongbin Ye, Koji Ohta, Mamoru Baba, Michiko Kusunoki. Surface modifications of aligned carbon nanotube thin films by Argon-ion sputtering. IEEJ Transactions on Electrical and Electronic Engineering. 2012. 7. 4. 436-437