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J-GLOBAL ID：200901033357458742   Update date: Jul. 19, 2024

Kimura Yoshihide

キムラ ヨシヒデ | Kimura Yoshihide
Affiliation and department：
Osaka University Graduate School of Engineering, Department of Applied Physics

About Osaka University Graduate School of Engineering, Department of Applied Physics


Job title： Associate Professor
Research field  (3)： Measurement engineering ,  Computational science ,  Thin-film surfaces and interfaces
Research keywords  (6)： 電子回路技術 ,  真空技術 ,  表面物性 ,  Electronics ,  Vacuum technology ,  Surface Sience
Research theme for competitive and other funds  (6)：
  • 超高真空REM電子顕微鏡に関する研究
  • 電子線ホログラムに関する研究
  • コインシデンス電子顕微鏡の開発
  • Study on UHV REM
  • Study on Electron Hologram
Show all
Papers (28)：
  • Takahiro Tamura, Yoshihide Kimura, Yoshizo Takai. Development of a real-time wave field reconstruction TEM system (II): correction of coma aberration and 3-fold astigmatism, and real-time correction of 2-fold astigmatism. Microscopy (Oxford, England). 2018. 67. 1. 37-45
  • Takahiro Tamura, Yoshihide Kimura, Yoshizo Takai. Development of a real-time wave field reconstruction TEM system (I): incorporation of an auto focus tracking system. MICROSCOPY. 2017. 66. 3. 172-181
  • Takaomi Matsutani, Masaki Taya, Takeo Tanaka, Yoshihide Kimura, Yoshizo Takai, Tadahiro Kawasaki, Mikio Ichihashi, Takashi Ikuta. Development of Parallel Image Detection System Using Annular Pupils for Scanning Transmission Electron Microscope. NEW TREND IN APPLIED PLASMA SCIENCE AND TECHNOLOGY. 2010. 1282. 111-+
  • Misa Hayashida, Yoshihide Kimura, Yoshizo Takai. Measurement of precision for developing automatic transmission electron microscope. SURFACE AND INTERFACE ANALYSIS. 2008. 40. 13. 1777-1780
  • TAKAI Yoshizo, KIMURA Yoshihide. Aberration Correction Based on Focus Modulation Transmission Electron Microscopy and its Applications. Shinku. 2008. 51. 11. 707-713
ｍore...
MISC (59)：
  • Hirabayashi Yuta, Kimura Yoshihide, Takai Yoshizo. Development of Wide Frequency Band Phase TEM System. JSAP Annual Meetings Extended Abstracts. 2017. 2017.1. 1632-1632
  • Tamura Takahiro, Kimura Yoshihide, Takai Yoshizo. Dynamic Analysis of Sample Thickness using Real-Time Wave Field Reconstruction Method. JSAP Annual Meetings Extended Abstracts. 2016. 2016.2. 1554-1554
  • Tamura Takahiro, Kimura Yoshihide, Takai Yoshizo. Development of Wave Field Reconstruction Transmission Electron Microscope System with Focus Tracking Function. JSAP Annual Meetings Extended Abstracts. 2016. 2016.1. 1581-1581
  • Nagai Shigekazu, Kawamura Ken, Kimura Yoshihide, Yoshii Junji, Ikeda Renzo, Shimizu Ryuichi. Development of Global Ionizing Radiation Monitoring Network using SrI2/MPPC. JSAP Annual Meetings Extended Abstracts. 2015. 2015.2. 437-437
  • Tamura Takahiro, Kimura Yoshihide, Takai Yoshizo. Development of Modulation Transmission Electron Microscope System with Focus Tracking Function. JSAP Annual Meetings Extended Abstracts. 2015. 2015.2. 1502-1502
ｍore...
Patents (8)：
ｍore...
Books (1)：
  • 波形計測によるX線半導体検出器の高精度検出時刻測定
    [木村吉秀] 2003
Works (5)：
  • 革新的設計・生産方式の開発と次世代光・電子融合システムの創成
    2004 -
  • 放射光-極微構造ナノスコープ
    2001 -
  • Nanoscope of synchrotron radiation-nanostructure
    2001 -
  • 次世代超電子顕微鏡の開発
    1996 - 2000
  • Development of Super TEM
    1996 - 2000
Education (4)：
  • - 1989 Osaka University
  • - 1989 Osaka University Graduate School, Division of Engineering
  • - 1986 Osaka University School of Engineering
  • - 1986 Osaka University Faculty of Engineering
Professional career (2)：
  • (BLANK) (Osaka University)
  • (BLANK) (Osaka University)
Work history (2)：
  • 1989 - 1999 Osaka University
  • 1989 - 1999 Osaka University, Research Assistant
Awards (1)：
  • 1999 - 日本電子顕微鏡学会論文賞
Association Membership(s) (2)：
日本電子顕微鏡学会 ,  応用物理学会
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