Fujisawa Satoru

フジサワサトル | Fujisawa Satoru

Affiliation and department：
Job title： Senior Researcher
Homepage URL (1)： http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=S44975913

Research field (7)： Measurement engineering , Machine elements and tribology , Design engineering , Thin-film surfaces and interfaces , Semiconductors, optical and atomic physics , Nanostructure physics , Nanostructure chemistry

Research keywords (1)： Micro-Tribology Scanning Probe Microscope (SPM) Atomic force Microscope (AFM) Frictioinal Force Microscope (FFM) Acoustic Emission (AE)

Papers (9)：

Fujisawa, Satoru, Mano, Hiroki, Miyake, Koji. A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope. Tribology Online. 2016. 11. 6. 646-652
MIYAKE Koji, FUJISAWA Satoru, KORENAGA Atsushi, ISHIDA Takao, SASAKI Shinya. Hardness Test in Nanometer Region by Atomic Force Microscopy. The proceedings of the JSME annual meeting. 2004. 2004. 0. 117-118
FUJISAWA Satoru. Elementrary Process of Friction with Friction Force Microscope. Bulletin of the Japan Institute of Metals. 2001. 40. 10. 844-846
T Kizuka, S Umehara, S Fujisawa. Metal-insulator transition in stable one-dimensional arrangements of single gold atoms. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS. 2001. 40. 1AB. L71-L74
S Fujisawa, K Yokoyama, Y Sugawara, S Morita. Analysis of experimental load dependence of two-dimensional atomic-scale friction. PHYSICAL REVIEW B. 1998. 58. 8. 4909-4916

ｍore...

MISC (13)：

FUJISAWA Satoru. S114043 Proposal of detection method of acoustic emission in scanning probe microscope. Mechanical Engineering Congress, Japan. 2013. 2013. "S114043-1"-"S114043-3"
FUJISAWA Satoru. S115025 Study on the S/N ratio of optical lever deflection method. Mechanical Engineering Congress, Japan. 2012. 2012. "S115025-1"-"S115025-3"
K Miyake, S Fujisawa, A Korenaga, T Ishida, S Sasaki. The effect of pile-up and contact area on hardness test by nanoindentation. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS. 2004. 43. 7B. 4602-4605
S Fujisawa, T Kikkawa, T Kizuka. Direct observation of electromigration and induced stress in Cu nanowire. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS. 2003. 42. 12A. L1433-L1435
S Fujisawa, H Ogiso. Compensation of cross talk in the optical lever deflection method used in atomic force microscopy. REVIEW OF SCIENTIFIC INSTRUMENTS. 2003. 74. 12. 5115-5117

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Awards (5)：

2005/03 - 2004 JSME FUNAI award
2002/07 - 2001 International Metallographic Contest
2002 - 24th JJAP paper award
2001/03 - Metal photograph award
1998/05 - Heisei 10 Japan Tribology Society Award

Association Membership(s) (2)：

日本機械学会 , トライボロジー学会

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