Art

J-GLOBAL ID：201702240233318889   Reference number：17A0503951

A Novel Detection Method for Acoustic Emission Using a Scanning Probe Microscope

走査プローブ顕微鏡を使ったアコースティックエミッションの新しい検出法

Author (3)： Fujisawa Satoru (National Institute of Advanced Industrial Science and Technology (AIST), Advanced Manufacturing Research Institute (AM-RI)) ,  Mano Hiroki (National Institute of Advanced Industrial Science and Technology (AIST), Advanced Manufacturing Research Institute (AM-RI)) ,  Miyake Koji (National Institute of Advanced Industrial Science and Technology (AIST), Advanced Manufacturing Research Institute (AM-RI))
Material： Tribology Online (Web)  (Tribol Online (Web))
Volume： 11  Issue： 6  Page： 646-652(J-STAGE)  Publication year： 2016 
JST Material Number： U0046A  ISSN： 1881-2198  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *nondestructive inspection ,  *length ,  *defect ,  *scanning probe microscope ,  *acoustic emission ,  *atomic force microscope
Semi thesaurus term： *atomic-scale

Author keywords (8)： mechanical processing ,  fracture mechanics scanning probe microscope (SPM) ,  acoustic emission (AE) ,  piezoelectric ,  tube scanner ,  scan signal ,  high pass filter ,  two-dimensional AE source location

JST classification (1)： Nondestructive testing  (HB02030F)

Reference (26)：

• [1] Binnig, G., Rohrer, H., Gerber, Ch. and Weibel, E., “Surface Studies by Scanning Tunneling Microscopy,” Physical Review Letters, 49, 1, 1982, 57-61.
• [2] Binnig, G., Quate, C. F. and Gerber, C., “Atomic Force Microscope,” Physical Review Letters, 56, 9, 1986, 930-933.
• [3] Coratger, R., Sivel, V., Ajustron, F. and Beauvillain, J., “Scanning Tunneling Microscopy and Related Techniques for Surface Analysis,” Micron, 25, 4, 1994, 371-385.
• [4] Meyer, G. and Amer, N. M., “Optical-Beam- Deflection Atomic Force Microscopy: The NaCl (001) Surface,” Applied Physics Letters, 56, 21, 1990, 2100-2101.
• [5] den Boef, A. J., “Scanning Force Microscopy Using a Simple Low-Noise Interferometer,” Applied Physics Letters, 55, 5, 1989, 439-441.

Terms in the title (3)： 走査プローブ顕微鏡 ,  アコースティックエミッション ,  検出法