Art
J-GLOBAL ID:200902148420983831   Reference number:01A0212498

Automatic Dose Optimization System for Resist Cross-Sectional Profile in a Electron Beam Lithography.

電子ビームリソグラフィーにおけるレジスト断面プロファイルの自動ドーズ最適化システム
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Volume: 39  Issue: 12B  Page: 6831-6835  Publication year: Dec. 30, 2000 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Manufacturing technology of solid-state devices  ,  Applications of electron beams and ion beams 
Reference (11):
  • 1) W. Daschner, M. Larsson and S. H. Lee: Appl. Opt. 34 (1995) 2534.
  • 2) D. Mikolas, R. Bojko, G. Craighead, F. Hass, D. Honey and H. Bare: J. Vac. Sci. & Technol. <B>B12</B> (1994) 20.
  • 3) L. Grella, E. Fabrizio, M. Gentili, M. Baciocchi and R. Maggiora: Microelectr. Eng. 35 (1997) 495.
  • 4) E.-B. Kley, B. Schnabel and U. D. Zeitner: Microelectr. Eng. 34 (1997) 261.
  • 5) T. Chang: J. Vac. Sci. & Technol. <B>12</B> (1975) 1271.
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