Art
J-GLOBAL ID:200902151500399694   Reference number:01A0728453

Reduction of Base-Collector Capacitance in Submicron InP/GaInAs Heterojunction Bipolar Transistors with Buried Tungsten Wires.

埋込みタングステン線を有するサブミクロンInP/GaInAsヘテロ接合バイポーラトランジスタにおけるベース-コレクタ容量の低減
Author (4):
Material:
Volume: 40  Issue: 7B  Page: L735-L737  Publication year: Jul. 15, 2001 
JST Material Number: F0599B  ISSN: 0021-4922  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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JST classification
Category name(code) classified by JST.
Transistors 
Reference (6):
  • 1) M. Sokolich, C. H. Fields and M. Madhav: IEEE Electron Device Lett. 22 (2001) 8.
  • 2) Q. Lee, S. C. Martin, D. Mensa, R. P. Smith, J. Guthrie, S. Jaganathan, T. Mathew, S. Krishnan, S. Ceran and M. J. W. Rodwell: <I>Proc. 11th Int. Conf. Indium Phosphide & Related Materials, Davos, Switzerland, 1999</I> (IEEE, Piscataway, 1999) p. 175.
  • 3) T. Arai, H. Tobita, Y. Harada, M. Suhara, Y. Miyamoto and K. Furuya: <I>Proc. 11th Int. Conf. Indium Phosphide & Related Materials, Davos, Switzerland, 1999</I> (IEEE, Piscataway, 1999) p. 183.
  • 4) T. Arai, Y. Harada, S. Yamagami, Y. Miyamoto and K. Furuya: Jpn. J. Appl. Phys. 39 (2000) L503.
  • 5) T. Arai, S. Yamagami, Y. Okuda, Y. Harada, Y. Miyamoto and K. Furuya: submitted to IEICE Trans. Electron.
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